Figures

Figure 1: Magnetization as a function of applied field for two NiO(500Å)/NiFe(100Å) films deposited simultaneously on different substrates are shown. a) shows the easy axis and hard axis response for the film deposited on an amorphous Al₂O₃ film. b) shows the response in the in- plane (100) directions on the (001) face of MgO, parallel and perpendicular to H_b.

Figure 2:Interface exchange energy, J = H_EM_st_NiFe, as a function of the x-ray intensity ratio of the NiO (111) to the NiO (200) reflections. The plot shows there is no correlation between the texture of the NiO buffer layer and the resulting exchange field.

Figure 3: Exchange field and coercive field for two NiO/NiFe coupled bilayer films as a function of temperature. The circles show H_E and H_c for a strongly exchange biased bilayer. The triangles show H_c for a bilayer with zero exchange field but elevated coercivity due to the interface coupling. H_E goes to zero at the blocking temperature, T_b, which is lower than the bulk Neel phase transition temperature, T_N (T_N = 250°C for NiO).